Travelled to:
1 × Canada
1 × Taiwan
3 × USA
Collaborated with:
F.Cheng M.Hung H.C.Yang Y.Lin C.Kao Y.Su J.Jian C.Tu C.Chen Y.Hsieh S.Wang Y.Huang T.Liao F.Chang M.Hsieh
Talks about:
metrolog (5) virtual (5) develop (5) automat (3) framework (2) industri (2) baselin (2) system (2) scheme (2) cloud (2)
Person: Hsien-Cheng Huang
DBLP: Huang:Hsien=Cheng
Contributed to:
Wrote 7 papers:
- CASE-2014-HungLHTC #development
- Development of a private cloud-based new-generation virtual metrology system (MHH, YCL, HCH, CCT, FTC), pp. 910–915.
- CASE-2013-ChenHCHW #automation #maintenance #predict
- Automatic baseline-sample-selection scheme for baseline predictive maintenance (CFC, YSH, FTC, HCH, SCW), pp. 183–188.
- CASE-2013-HungLHHYC #development #industrial
- Development of an advanced manufacturing cloud for machine tool industry based on AVM technology (MHH, YCL, HCH, MHH, HCY, FTC), pp. 189–194.
- CASE-2010-HungHYC #automation #development #framework #industrial
- Development of an automatic virtual metrology framework for TFT-LCD industry (MHH, HCH, HCY, FTC), pp. 879–884.
- CASE-2008-HuangHCLC #automation #design #implementation
- Automatic virtual metrology system design and implementation (YTH, HCH, FTC, TSL, FCC), pp. 223–229.
- CASE-2007-ChengHK #development
- Development of a Dual-Phase Virtual Metrology Scheme (FTC, HCH, CAK), pp. 270–275.
- CASE-2007-HuangSCJ #development #framework
- Development of a Generic Virtual Metrology Framework (HCH, YCS, FTC, JMJ), pp. 282–287.