Travelled to:1 × Germany
Collaborated with:E.J.Marinissen G.Vandling S.K.Goel F.Hapke N.Mittermaier S.Bahl
Talks about:technolog (1) process (1) detect (1) defect (1) advanc (1) solut (1) new (1) eda (1)
Person: Jason Rivers
DBLP: Rivers:Jason
Contributed to:
2012Wrote 1 papers:
- DATE-2012-MarinissenVGHRMB #detection #process
- EDA solutions to new-defect detection in advanced process technologies (EJM, GV, SKG, FH, JR, NM, SB), pp. 123–128.