Travelled to:1 × Germany
1 × USA
Collaborated with:S.K.Goel H.P.E.Vranken A.Glowatz J.Schlöffel E.J.Marinissen G.Vandling J.Rivers N.Mittermaier S.Bahl
Talks about:detect (2) technolog (1) diagnosi (1) respons (1) process (1) compact (1) pariti (1) defect (1) advanc (1) space (1)
Person: Friedrich Hapke
DBLP: Hapke:Friedrich
Contributed to:
2012
2006Wrote 2 papers:
- DATE-2012-MarinissenVGHRMB #detection #process
- EDA solutions to new-defect detection in advanced process technologies (EJM, GV, SKG, FH, JR, NM, SB), pp. 123–128.
- DAC-2006-VrankenGGSH #detection #fault
- Fault detection and diagnosis with parity trees for space compaction of test responses (HPEV, SKG, AG, JS, FH), pp. 1095–1098.