Travelled to:1 × Germany
1 × USA
Collaborated with:P.Engelke I.Polian B.Becker H.P.E.Vranken S.K.Goel A.Glowatz F.Hapke
Talks about:fault (2) industri (1) diagnosi (1) respons (1) compact (1) circuit (1) resist (1) pariti (1) detect (1) space (1)
Person: Jürgen Schlöffel
DBLP: Schl=ouml=ffel:J=uuml=rgen
Contributed to:
2008
2006Wrote 2 papers:
- DATE-2008-EngelkePSB #fault #industrial #simulation
- Resistive Bridging Fault Simulation of Industrial Circuits (PE, IP, JS, BB), pp. 628–633.
- DAC-2006-VrankenGGSH #detection #fault
- Fault detection and diagnosis with parity trees for space compaction of test responses (HPEV, SKG, AG, JS, FH), pp. 1095–1098.