Travelled to:
2 × USA
Collaborated with:
Y.Zhang L.Cheng P.Gupta C.J.Spanos L.He
Talks about:
model (2) systemat (1) variabl (1) spatial (1) process (1) predict (1) justifi (1) control (1) variat (1) plasma (1)
Person: Kun Qian
DBLP: Qian:Kun
Contributed to:
Wrote 2 papers:
- DAC-2009-ChengGSQH #modelling #variability
- Physically justifiable die-level modeling of spatial variation in view of systematic across wafer variability (LC, PG, CJS, KQ, LH), pp. 104–109.
- CASE-2008-QianZ #pipes and filters #predict #process
- Optimal model predictive control of plasma pipe welding process (KQ, YZ), pp. 492–497.