Travelled to:
1 × France
1 × Germany
1 × USA
Collaborated with:
K.(.Cheng N.Lesperance Y.Zheng M.Gao J.Bovington S.Yang K.Cheng
Talks about:
mutat (2) reconfigur (1) discount (1) communic (1) systemc (1) coverag (1) analysi (1) scemit (1) inject (1) effici (1)
Person: Peter Lisherness
DBLP: Lisherness:Peter
Contributed to:
Wrote 3 papers:
- DATE-2013-LishernessLC #analysis #mutation testing
- Mutation analysis with coverage discounting (PL, NL, KT(C), pp. 31–34.
- DATE-2012-ZhengLGBYC #communication #configuration management #power management
- Power-efficient calibration and reconfiguration for on-chip optical communication (YZ, PL, MG, JB, SY, KTC), pp. 1501–1506.
- DAC-2010-LishernessC #fault #injection #named
- SCEMIT: a systemc error and mutation injection tool (PL, KT(C), pp. 228–233.