Travelled to:1 × USA
Collaborated with:G.Saucier
Talks about:testabl (1) circuit (1) design (1) vlsi (1) down (1) top (1)
Person: Philippe Basset
DBLP: Basset:Philippe
Contributed to:
Wrote 1 papers:
- DAC-1982-BassetS #design #testing #top-down
- Top down design and testability of VLSI circuits (PB, GS), pp. 851–857.












