Travelled to:2 × USA
Collaborated with:∅ A.Orailoglu H.Zhang Y.Du M.D.F.Wong
Talks about:manufactur (1) decomposit (1) correspond (1) thermomet (1) structur (1) diagnosi (1) challeng (1) approach (1) process (1) pattern (1)
Person: Rasit Onur Topaloglu
DBLP: Topaloglu:Rasit_Onur
Contributed to:
20112005Wrote 3 papers:
- DAC-2011-Topaloglu #3d #challenge #integration
- Applications driving 3D integration and corresponding manufacturing challenges (ROT), pp. 220–223.
- DAC-2011-ZhangDWT #composition #detection #self
- Self-aligned double patterning decomposition for overlay minimization and hot spot detection (HZ, YD, MDFW, ROT), pp. 71–76.
- DAC-2005-TopalogluO #approach #process
- A DFT approach for diagnosis and process variation-aware structural test of thermometer coded current steering DACs (ROT, AO), pp. 851–856.