Travelled to:
2 × USA
Collaborated with:
P.Gupta A.B.Kahng D.Sylvester S.Shah
Talks about:
shorten (1) extract (1) analysi (1) failur (1) dimens (1) critic (1) advanc (1) alway (1) time (1) post (1)
Person: Youngmin Kim
DBLP: Kim:Youngmin
Contributed to:
Wrote 2 papers:
- DAC-2007-GuptaKKSS
- Line-End Shortening is Not Always a Failure (PG, ABK, YK, SS, DS), pp. 270–271.
- DAC-2005-GuptaKKS #analysis
- Advanced Timing Analysis Based on Post-OPC Extraction of Critical Dimensions (PG, ABK, YK, DS), pp. 365–368.