Travelled to:4 × USA
Collaborated with:D.Sylvester P.Gupta A.B.Kahng D.Blaauw V.Veetil S.Rochel Y.Kim A.Srivastava K.Agarwal S.W.Director
Talks about:leakag (3) variat (2) effici (2) consid (2) standard (1) parametr (1) shorten (1) perform (1) librari (1) analysi (1)
Person: Saumil Shah
DBLP: Shah:Saumil
Contributed to:
2009200720062005Wrote 4 papers:
- DAC-2009-VeetilSBSR #analysis #dependence #performance
- Efficient smart sampling based full-chip leakage analysis for intra-die variation considering state dependence (VV, DS, DB, SS, SR), pp. 154–159.
- DAC-2007-GuptaKKSS
- Line-End Shortening is Not Always a Failure (PG, ABK, YK, SS, DS), pp. 270–271.
- DAC-2006-ShahGK #library #optimisation #reduction #standard
- Standard cell library optimization for leakage reduction (SS, PG, ABK), pp. 983–986.
- DAC-2005-SrivastavaSASBD #correlation #estimation #parametricity #performance #power management
- Accurate and efficient gate-level parametric yield estimation considering correlated variations in leakage power and performance (AS, SS, KA, DS, DB, SWD), pp. 535–540.