Chin-Chi Teng, Yi-Kan Cheng, Elyse Rosenbaum, Sung-Mo Kang
Hierarchical Electromigration Reliability Diagnosis for VLSI Interconnects
DAC, 1996.
@inproceedings{DAC-1996-TengCRK,
author = "Chin-Chi Teng and Yi-Kan Cheng and Elyse Rosenbaum and Sung-Mo Kang",
booktitle = "{Proceedings of the 33rd Design Automation Conference}",
doi = "10.1145/240518.240661",
isbn = "0-89791-779-0",
pages = "752--757",
publisher = "{ACM Press}",
title = "{Hierarchical Electromigration Reliability Diagnosis for VLSI Interconnects}",
year = 1996,
}