Accurate and efficient gate-level parametric yield estimation considering correlated variations in leakage power and performance
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Ashish Srivastava, Saumil Shah, Kanak Agarwal, Dennis Sylvester, David Blaauw, Stephen W. Director
Accurate and efficient gate-level parametric yield estimation considering correlated variations in leakage power and performance
DAC, 2005.

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@inproceedings{DAC-2005-SrivastavaSASBD,
	author        = "Ashish Srivastava and Saumil Shah and Kanak Agarwal and Dennis Sylvester and David Blaauw and Stephen W. Director",
	booktitle     = "{Proceedings of the 42nd Design Automation Conference}",
	doi           = "10.1145/1065579.1065718",
	isbn          = "1-59593-058-2",
	pages         = "535--540",
	publisher     = "{ACM}",
	title         = "{Accurate and efficient gate-level parametric yield estimation considering correlated variations in leakage power and performance}",
	year          = 2005,
}

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