@inproceedings{DATE-2013-ZordanBDGTVB,
	acmid         = "2485394",
	author        = "Leonardo Bonet Zordan and Alberto Bosio and Luigi Dilillo and Patrick Girard and Aida Todri and Arnaud Virazel and Nabil Badereddine",
	booktitle     = "{Proceedings of the 17th Conference on Design, Automation and Test in Europe}",
	isbn          = "978-1-4503-2153-2",
	pages         = "442--447",
	publisher     = "{EDA Consortium San Jose, CA, USA / ACM DL}",
	title         = "{Test solution for data retention faults in low-power SRAMs}",
	year          = 2013,
}