Travelled to:1 × France
1 × USA
Collaborated with:A.Bosio L.Dilillo P.Girard A.Virazel L.B.Zordan A.Todri R.A.Fonseca S.Pravossoudovitch
Talks about:sram (2) statist (1) reliabl (1) analysi (1) retent (1) method (1) solut (1) simul (1) power (1) fault (1)
Person: Nabil Badereddine
DBLP: Badereddine:Nabil
Contributed to:
2013
2010Wrote 2 papers:
- DATE-2013-ZordanBDGTVB #fault #power management
- Test solution for data retention faults in low-power SRAMs (LBZ, AB, LD, PG, AT, AV, NB), pp. 442–447.
- DAC-2010-FonsecaDBGPVB #analysis #reliability #simulation #statistics
- A statistical simulation method for reliability analysis of SRAM core-cells (RAF, LD, AB, PG, SP, AV, NB), pp. 853–856.