Travelled to:
1 × France
Collaborated with:
A.Bosio L.Dilillo P.Girard A.Todri A.Virazel N.Badereddine
Talks about:
retent (1) solut (1) power (1) fault (1) test (1) sram (1) data (1) low (1)
Person: Leonardo Bonet Zordan
DBLP: Zordan:Leonardo_Bonet
Contributed to:
Wrote 1 papers:
- DATE-2013-ZordanBDGTVB #fault #power management
- Test solution for data retention faults in low-power SRAMs (LBZ, AB, LD, PG, AT, AV, NB), pp. 442–447.