Travelled to:2 × France
5 × USA
Collaborated with:B.Franzini P.McNamara M.Bertoletti N.Dragone S.Saxena M.Chinosi R.Zafalon C.Forzan A.D.Fabbro L.Croce M.Malcotti P.Schumaker D.Coder P.Azzoni F.Fummi W.Vendraminetto L.Daldoss S.Zanella W.Xiang S.Liu M.Casale-Rossi A.J.Strojwas R.C.Aitken A.Domic P.Magarshack D.Pattullo J.Sawicki N.A.Sherwani S.L.Mack A.Alexanian P.Buch H.Lehon P.Rabkin A.Sharan
Talks about:dfm (3) standard (2) circuit (2) effect (2) analog (2) simul (2) optim (2) digit (2) accur (2) cell (2)
Person: Carlo Guardiani
DBLP: Guardiani:Carlo
Contributed to:
2007
200520022000199919971995Wrote 9 papers:
- DATE-2007-AzzoniBDFGV #optimisation
- Yield-aware placement optimization (PA, MB, ND, FF, CG, WV), pp. 1232–1237.
- DATE-2007-Casale-RossiSADGMPS #named #product line #question #trust
- DFM/DFY: should you trust the surgeon or the family doctor? (MCR, AJS, RCA, AD, CG, PM, DP, JS), pp. 439–442.
- DAC-2005-GuardianiBDMM #effectiveness #process
- An effective DFM strategy requires accurate process and IP pre-characterization (CG, MB, ND, MM, PM), pp. 760–761.
- DAC-2005-SherwaniMABGLRS #exclamation
- DFM rules! (NAS, SLM, AA, PB, CG, HL, PR, AS), pp. 168–169.
- DATE-2002-GuardianiMDSZXL #optimisation #testing
- Analog IP Testing: Diagnosis and Optimization (CG, PM, LD, SS, SZ, WX, SL), pp. 192–196.
- DAC-2000-GaurdianiSMSC #bound #component #constant #simulation #statistics
- An asymptotically constant, linearly bounded methodology for the statistical simulation of analog circuits including component mismatch effects (CG, SS, PM, PS, DC), pp. 15–18.
- DAC-1999-ChinosiZG #clustering #parallel #simulation
- Parallel Mixed-Level Power Simulation Based on Spatio-Temporal Circuit Partitioning (MC, RZ, CG), pp. 562–567.
- DAC-1997-ForzanFG #megamodelling #performance #standard
- Accurate and Efficient Macromodel of Submicron Digital Standard Cells (CF, BF, CG), pp. 633–637.
- DAC-1995-FabbroFCG #modelling #probability #standard #worst-case
- An Assigned Probability Technique to Derive Realistic Worst-Case Timing Models of Digital Standard Cells (ADF, BF, LC, CG), pp. 702–706.