Sylvain Housseman, Stéphane Dauzère-Pérès, Gloria Rodríguez-Verján, Jacques Pinaton
Smart dynamic sampling for wafer at risk reduction in semiconductor manufacturing
CASE, 2014.
@inproceedings{CASE-2014-HoussemanDRP,
author = "Sylvain Housseman and Stéphane Dauzère-Pérès and Gloria Rodríguez-Verján and Jacques Pinaton",
booktitle = "{Proceedings of the 10th International Conference on Automation Science and Engineering}",
doi = "10.1109/CoASE.2014.6899414",
pages = "780--785",
publisher = "{IEEE}",
title = "{Smart dynamic sampling for wafer at risk reduction in semiconductor manufacturing}",
year = 2014,
}