Travelled to:
1 × Taiwan
Collaborated with:
S.Dauzère-Pérès G.Rodríguez-Verján J.Pinaton
Talks about:
semiconductor (1) manufactur (1) reduct (1) wafer (1) smart (1) sampl (1) dynam (1) risk (1)
Person: Sylvain Housseman
DBLP: Housseman:Sylvain
Contributed to:
Wrote 1 papers:
- CASE-2014-HoussemanDRP #reduction
- Smart dynamic sampling for wafer at risk reduction in semiconductor manufacturing (SH, SDP, GRV, JP), pp. 780–785.