David Van Campenhout, Trevor N. Mudge, John P. Hayes
High-Level Test Generation for Design Verification of Pipelined Microprocessors
DAC, 1999.
@inproceedings{DAC-1999-CampenhoutMH,
author = "David Van Campenhout and Trevor N. Mudge and John P. Hayes",
booktitle = "{Proceedings of the 36th Design Automation Conference}",
doi = "10.1145/309847.309912",
pages = "185--188",
publisher = "{ACM Press}",
title = "{High-Level Test Generation for Design Verification of Pipelined Microprocessors}",
year = 1999,
}