Xiaoliang Bai, Sujit Dey, Janusz Rajski
Self-test methodology for at-speed test of crosstalk in chip interconnects
DAC, 2000.
@inproceedings{DAC-2000-BaiDR,
author = "Xiaoliang Bai and Sujit Dey and Janusz Rajski",
booktitle = "{Proceedings of the 37th Design Automation Conference}",
doi = "10.1145/337292.337597",
pages = "619--624",
publisher = "{ACM}",
title = "{Self-test methodology for at-speed test of crosstalk in chip interconnects}",
year = 2000,
}