Statistical timing for parametric yield prediction of digital integrated circuits
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Jochen A. G. Jess, K. Kalafala, Srinath R. Naidu, Ralph H. J. M. Otten, Chandramouli Visweswariah
Statistical timing for parametric yield prediction of digital integrated circuits
DAC, 2003.

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@inproceedings{DAC-2003-JessKNOV,
	author        = "Jochen A. G. Jess and K. Kalafala and Srinath R. Naidu and Ralph H. J. M. Otten and Chandramouli Visweswariah",
	booktitle     = "{Proceedings of the 40th Design Automation Conference}",
	doi           = "10.1145/775832.776066",
	isbn          = "1-58113-688-9",
	pages         = "932--937",
	publisher     = "{ACM}",
	title         = "{Statistical timing for parametric yield prediction of digital integrated circuits}",
	year          = 2003,
}

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