Travelled to:1 × Germany
1 × USA
Collaborated with:E.T.A.F.Jacobs J.A.G.Jess K.Kalafala R.H.J.M.Otten C.Visweswariah
Talks about:circuit (2) parametr (1) statist (1) predict (1) static (1) leakag (1) integr (1) yield (1) stand (1) power (1)
Person: Srinath R. Naidu
DBLP: Naidu:Srinath_R=
Contributed to:
2003
2001Wrote 2 papers:
- DAC-2003-JessKNOV #parametricity #predict #statistics
- Statistical timing for parametric yield prediction of digital integrated circuits (JAGJ, KK, SRN, RHJMO, CV), pp. 932–937.
- DATE-2001-NaiduJ #power management
- Minimizing stand-by leakage power in static CMOS circuits (SRN, ETAFJ), pp. 370–376.