Dong Xiang, Shan Gu, Jia-Guang Sun, Yu-Liang Wu
A cost-effective scan architecture for scan testing with non-scan test power and test application cost
DAC, 2003.
@inproceedings{DAC-2003-XiangGSW,
author = "Dong Xiang and Shan Gu and Jia-Guang Sun and Yu-Liang Wu",
booktitle = "{Proceedings of the 40th Design Automation Conference}",
doi = "10.1145/775832.776022",
isbn = "1-58113-688-9",
pages = "744--747",
publisher = "{ACM}",
title = "{A cost-effective scan architecture for scan testing with non-scan test power and test application cost}",
year = 2003,
}











