Dong Xiang, Shan Gu, Jia-Guang Sun, Yu-Liang Wu
A cost-effective scan architecture for scan testing with non-scan test power and test application cost
DAC, 2003.
@inproceedings{DAC-2003-XiangGSW, author = "Dong Xiang and Shan Gu and Jia-Guang Sun and Yu-Liang Wu", booktitle = "{Proceedings of the 40th Design Automation Conference}", doi = "10.1145/775832.776022", isbn = "1-58113-688-9", pages = "744--747", publisher = "{ACM}", title = "{A cost-effective scan architecture for scan testing with non-scan test power and test application cost}", year = 2003, }