Travelled to:1 × USA
Collaborated with:D.Xiang J.Sun Y.Wu
Talks about:test (3) scan (3) cost (2) architectur (1) effect (1) applic (1) power (1) non (1)
Person: Shan Gu
DBLP: Gu:Shan
Contributed to:
Wrote 1 papers:
- DAC-2003-XiangGSW #architecture #effectiveness #testing
- A cost-effective scan architecture for scan testing with non-scan test power and test application cost (DX, SG, JGS, YLW), pp. 744–747.












