Estimation of the Defective IDDQ Caused by Shorts in Deep-Submicron CMOS ICs
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Rosa Rodríguez-Montañés, Joan Figueras
Estimation of the Defective IDDQ Caused by Shorts in Deep-Submicron CMOS ICs
DATE, 1998.

DATE 1998
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@inproceedings{DATE-1998-Rodriguez-MontanesF,
	author        = "Rosa Rodríguez-Montañés and Joan Figueras",
	booktitle     = "{Proceedings of the Third Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.1998.655903",
	pages         = "490--494",
	publisher     = "{IEEE Computer Society}",
	title         = "{Estimation of the Defective IDDQ Caused by Shorts in Deep-Submicron CMOS ICs}",
	year          = 1998,
}

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