Travelled to:3 × France
Collaborated with:J.Figueras E.I.Vatajelu M.Indaco M.Renovell P.Prinetto
Talks about:defect (2) estim (2) cmos (2) submicron (1) transfer (1) sequenti (1) testabl (1) current (1) circuit (1) analysi (1)
Person: Rosa Rodríguez-Montañés
DBLP: Rodr=iacute=guez-Monta=ntilde==eacute=s:Rosa
Contributed to:
201519981994Wrote 3 papers:
- DATE-2015-VatajeluRIRPF #estimation #metric #robust
- Read/write robustness estimation metrics for spin transfer torque (STT) MRAM cell (EIV, RRM, MI, MR, PP, JF), pp. 447–452.
- DATE-1998-Rodriguez-MontanesF #estimation
- Estimation of the Defective IDDQ Caused by Shorts in Deep-Submicron CMOS ICs (RRM, JF), pp. 490–494.
- EDAC-1994-Rodriguez-MontanesF #analysis #fault #testing
- Analysis of Bridging Defects in Sequential CMOS Circuits and their Current Testability (RRM, JF), pp. 356–360.