Jongchul Shin, Hyunjin Kim, Sungho Kang
At-Speed Boundary-Scan Interconnect Testing in a Board with Multiple System Clocks
DATE, 1999.
@inproceedings{DATE-1999-ShinKK,
author = "Jongchul Shin and Hyunjin Kim and Sungho Kang",
booktitle = "{Proceedings of the Fourth Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.1999.761168",
isbn = "0-7695-0078-1",
pages = "473--None",
publisher = "{IEEE Computer Society}",
title = "{At-Speed Boundary-Scan Interconnect Testing in a Board with Multiple System Clocks}",
year = 1999,
}