Travelled to:
1 × Germany
Collaborated with:
H.Kim S.Kang
Talks about:
interconnect (1) boundari (1) multipl (1) system (1) speed (1) clock (1) board (1) test (1) scan (1)
Person: Jongchul Shin
DBLP: Shin:Jongchul
Contributed to:
Wrote 1 papers:
- DATE-1999-ShinKK #bound #multi #testing
- At-Speed Boundary-Scan Interconnect Testing in a Board with Multiple System Clocks (JS, HK, SK), p. 473–?.