Irith Pomeranz, Sudhakar M. Reddy
The Accidental Detection Index as a Fault Ordering Heuristic for Full-Scan Circuits
DATE, 2005.
@inproceedings{DATE-2005-PomeranzR05a,
author = "Irith Pomeranz and Sudhakar M. Reddy",
booktitle = "{Proceedings of the Ninth Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2005.306",
isbn = "0-7695-2288-2",
pages = "1008--1013",
publisher = "{IEEE Computer Society}",
title = "{The Accidental Detection Index as a Fault Ordering Heuristic for Full-Scan Circuits}",
year = 2005,
}