Huaxing Tang, Gang Chen, Sudhakar M. Reddy, Chen Wang, Janusz Rajski, Irith Pomeranz
Defect Aware Test Patterns
DATE, 2005.
@inproceedings{DATE-2005-TangCRWRP,
author = "Huaxing Tang and Gang Chen and Sudhakar M. Reddy and Chen Wang and Janusz Rajski and Irith Pomeranz",
booktitle = "{Proceedings of the Ninth Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2005.110",
isbn = "0-7695-2288-2",
pages = "450--455",
publisher = "{IEEE Computer Society}",
title = "{Defect Aware Test Patterns}",
year = 2005,
}
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