Travelled to:
1 × Germany
Collaborated with:
G.Chen S.M.Reddy C.Wang J.Rajski I.Pomeranz
Talks about:
pattern (1) defect (1) test (1) awar (1)
Person: Huaxing Tang
DBLP: Tang:Huaxing
Contributed to:
Wrote 1 papers:
- DATE-2005-TangCRWRP #fault
- Defect Aware Test Patterns (HT, GC, SMR, CW, JR, IP), pp. 450–455.