Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits
BibSLEIGH corpus
BibSLEIGH tags
BibSLEIGH bundles
BibSLEIGH people
EDIT!
CC-BY
Open Knowledge
XHTML 1.0 W3C Rec
CSS 2.1 W3C CanRec
email twitter

Dragoljub Gagi Drmanac, Nik Sumikawa, LeRoy Winemberg, Li-C. Wang, Magdy S. Abadir
Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits
DATE, 2011.

DATE 2011
DBLP
Scholar
Full names Links ISxN
@inproceedings{DATE-2011-DrmanacSWWA,
	author        = "Dragoljub Gagi Drmanac and Nik Sumikawa and LeRoy Winemberg and Li-C. Wang and Magdy S. Abadir",
	booktitle     = "{Proceedings of the 15th Conference on Design, Automation and Test in Europe}",
	isbn          = "978-1-61284-208-0",
	pages         = "794--799",
	publisher     = "{IEEE}",
	title         = "{Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits}",
	year          = 2011,
}

Tags:



Bibliography of Software Language Engineering in Generated Hypertext (BibSLEIGH) is created and maintained by Dr. Vadim Zaytsev.
Hosted as a part of SLEBOK on GitHub.