Dragoljub Gagi Drmanac, Nik Sumikawa, LeRoy Winemberg, Li-C. Wang, Magdy S. Abadir
Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits
DATE, 2011.
@inproceedings{DATE-2011-DrmanacSWWA,
author = "Dragoljub Gagi Drmanac and Nik Sumikawa and LeRoy Winemberg and Li-C. Wang and Magdy S. Abadir",
booktitle = "{Proceedings of the 15th Conference on Design, Automation and Test in Europe}",
isbn = "978-1-61284-208-0",
pages = "794--799",
publisher = "{IEEE}",
title = "{Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits}",
year = 2011,
}