Travelled to:1 × USA
2 × France
Collaborated with:S.Wang M.Tehranipoor E.Yilmaz G.Shofner S.Ozev D.G.Drmanac N.Sumikawa L.Wang M.S.Abadir
Talks about:optim (2) field (2) test (2) set (2) multidimension (1) parametr (1) industri (1) tighter (1) predict (1) perform (1)
Person: LeRoy Winemberg
DBLP: Winemberg:LeRoy
Contributed to:
2013
20112011Wrote 3 papers:
- DATE-2013-YilmazSWO #analysis #fault #industrial #scalability #simulation
- Fault analysis and simulation of large scale industrial mixed-signal circuits (EY, GS, LW, SO), pp. 565–570.
- DAC-2011-WangTW #metric #optimisation
- In-field aging measurement and calibration for power-performance optimization (SW, MT, LW), pp. 706–711.
- DATE-2011-DrmanacSWWA #multi #optimisation #parametricity #predict #testing
- Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits (DGD, NS, LW, LCW, MSA), pp. 794–799.