Travelled to:
1 × France
Collaborated with:
D.G.Drmanac L.Winemberg L.Wang M.S.Abadir
Talks about:
test (2) set (2) multidimension (1) parametr (1) tighter (1) predict (1) failur (1) wafer (1) probe (1) optim (1)
Person: Nik Sumikawa
DBLP: Sumikawa:Nik
Contributed to:
Wrote 1 papers:
- DATE-2011-DrmanacSWWA #multi #optimisation #parametricity #predict #testing
- Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits (DGD, NS, LW, LCW, MSA), pp. 794–799.