Sensitivity-Based Modeling and Methodology for Full-Chip Substrate Noise Analysis
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Rajeev Murgai, Subodh M. Reddy, Takashi Miyoshi, Takeshi Horie, Mehdi Baradaran Tahoori
Sensitivity-Based Modeling and Methodology for Full-Chip Substrate Noise Analysis
DATE, 2004.

DATE v1 2004
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@inproceedings{DATE-v1-2004-MurgaiRMHT,
	author        = "Rajeev Murgai and Subodh M. Reddy and Takashi Miyoshi and Takeshi Horie and Mehdi Baradaran Tahoori",
	booktitle     = "{Proceedings of the Eighth Conference on Design, Automation and Test in Europe, Volume 1}",
	doi           = "10.1109/DATE.2004.1268912",
	isbn          = "0-7695-2085-5",
	pages         = "610--615",
	publisher     = "{IEEE Computer Society}",
	title         = "{Sensitivity-Based Modeling and Methodology for Full-Chip Substrate Noise Analysis}",
	year          = 2004,
}

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