Rajeev Murgai, Subodh M. Reddy, Takashi Miyoshi, Takeshi Horie, Mehdi Baradaran Tahoori
Sensitivity-Based Modeling and Methodology for Full-Chip Substrate Noise Analysis
DATE, 2004.
@inproceedings{DATE-v1-2004-MurgaiRMHT,
author = "Rajeev Murgai and Subodh M. Reddy and Takashi Miyoshi and Takeshi Horie and Mehdi Baradaran Tahoori",
booktitle = "{Proceedings of the Eighth Conference on Design, Automation and Test in Europe, Volume 1}",
doi = "10.1109/DATE.2004.1268912",
isbn = "0-7695-2085-5",
pages = "610--615",
publisher = "{IEEE Computer Society}",
title = "{Sensitivity-Based Modeling and Methodology for Full-Chip Substrate Noise Analysis}",
year = 2004,
}