Travelled to:
1 × France
Collaborated with:
R.Murgai S.M.Reddy T.Horie M.B.Tahoori
Talks about:
methodolog (1) substrat (1) analysi (1) sensit (1) model (1) nois (1) full (1) chip (1) base (1)
Person: Takashi Miyoshi
DBLP: Miyoshi:Takashi
Contributed to:
Wrote 1 papers:
- DATE-v1-2004-MurgaiRMHT #analysis #modelling
- Sensitivity-Based Modeling and Methodology for Full-Chip Substrate Noise Analysis (RM, SMR, TM, TH, MBT), pp. 610–615.