Travelled to:3 × USA
Collaborated with:J.Rajski J.Tyszer D.Czysz M.Gebala N.Mukherjee
Talks about:test (3) decompressor (1) compactor (1) selector (1) programm (1) compress (1) respons (1) applic (1) power (1) impli (1)
Person: Grzegorz Mrugalski
DBLP: Mrugalski:Grzegorz
Contributed to:
201420072006Wrote 3 papers:
- DAC-2014-GebalaMMRT #on the #using
- On Using Implied Values in EDT-based Test Compression (MG, GM, NM, JR, JT), p. 6.
- DAC-2007-MrugalskiRCT #power management #testing
- New Test Data Decompressor for Low Power Applications (GM, JR, DC, JT), pp. 539–544.
- DAC-2006-MrugalskiRT #programmable
- Test response compactor with programmable selector (GM, JR, JT), pp. 1089–1094.