Travelled to:1 × Germany
Collaborated with:S.Ozev D.J.Sorin
Talks about:breakdown (1) concurr (1) circuit (1) defect (1) model (1) level (1) test (1) oxid (1) oper (1) gate (1)
Person: Jonathan R. Carter
DBLP: Carter:Jonathan_R=
Contributed to:
2005Wrote 1 papers:
- DATE-2005-CarterOS #concurrent #fault #modelling #testing
- Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown (JRC, SO, DJS), pp. 300–305.