Travelled to:
1 × Germany
3 × USA
Collaborated with:
W.C.Tam R.D.(.Blanton R.D.Blanton Y.Lin N.K.Bhatti H.Wang X.Yu S.Liu I.Komara
Talks about:
diagnosi (3) failur (2) autom (2) test (2) creation (1) pattern (1) circuit (1) analysi (1) select (1) precis (1)
Person: Osei Poku
DBLP: Poku:Osei
Contributed to:
Wrote 4 papers:
- DAC-2012-WangPYLKB #optimisation #testing
- Test-data volume optimization for diagnosis (HW, OP, XY, SL, IK, RDB), pp. 567–572.
- DAC-2009-TamPB #automation #validation
- Automated failure population creation for validating integrated circuit diagnosis methods (WCT, OP, RD(B), pp. 708–713.
- DAC-2008-TamPB #analysis #automation #layout #locality #precise #using
- Precise failure localization using automated layout analysis of diagnosis candidates (WCT, OP, RD(B), pp. 367–372.
- DATE-2008-LinPBB #detection
- Physically-Aware N-Detect Test Pattern Selection (YTL, OP, NKB, RDB), pp. 634–639.