Travelled to:1 × USA
Collaborated with:S.Dasgupta M.C.Graf R.A.Rasmussen T.W.Williams
Talks about:partition (1) techniqu (1) testabl (1) partit (1) design (1) vlsi (1) chip (1) aid (1)
Person: Ron G. Walther
DBLP: Walther:Ron_G=
Contributed to:
1984Wrote 1 papers:
- DAC-1984-DasguptaGRWW #clustering #design #testing
- Chip partitioning aid: A design technique for partitionability and testability in VLSI (SD, MCG, RAR, RGW, TWW), pp. 203–208.