Travelled to:3 × USA
Collaborated with:R.V.Joshi S.R.Nassif T.Lehner B.Agrawal E.Rosenbaum Z.Li J.Hayes
Talks about:character (1) presenc (1) analysi (1) static (1) mixtur (1) import (1) failur (1) design (1) applic (1) yield (1)
Person: Rouwaida Kanj
DBLP: Kanj:Rouwaida
Contributed to:
201220062004Wrote 3 papers:
- DAC-2012-KanjJLHN #estimation #multi
- Yield estimation via multi-cones (RK, RVJ, ZL, JH, SRN), pp. 1107–1112.
- DAC-2006-KanjJN #analysis #design
- Mixture importance sampling and its application to the analysis of SRAM designs in the presence of rare failure events (RK, RVJ, SRN), pp. 69–72.
- DAC-2004-KanjLAR
- Noise characterization of static CMOS gates (RK, TL, BA, ER), pp. 888–893.