Travelled to:2 × USA
Collaborated with:R.Huang H.Yang M.C.Chao C.Chin
Talks about:dram (2) industri (1) specif (1) hammer (1) applic (1) altern (1) studi (1) model (1) macro (1) fault (1)
Person: Shih-Chin Lin
DBLP: Lin:Shih=Chin
Contributed to:
20122009Wrote 2 papers:
- DAC-2012-HuangYCL #case study #industrial
- Alternate hammering test for application-specific DRAMs and an industrial case study (RFH, HYY, MCTC, SCL), pp. 1012–1017.
- DAC-2009-ChaoYHLC #fault #metaprogramming #modelling
- Fault models for embedded-DRAM macros (MCTC, HYY, RFH, SCL, CYC), pp. 714–719.