Travelled to:
1 × France
1 × Germany
3 × USA
Collaborated with:
K.Cheng R.Huang H.Yang S.Lin S.Wang S.T.Chakradhar W.Wei L.Wang C.Chin
Talks about:
test (4) compactor (2) unknown (2) space (2) dram (2) use (2) industri (1) respons (1) qualiti (1) presenc (1)
Person: Mango Chia-Tso Chao
DBLP: Chao:Mango_Chia=Tso
Contributed to:
Wrote 5 papers:
- DAC-2012-HuangYCL #case study #industrial
- Alternate hammering test for application-specific DRAMs and an industrial case study (RFH, HYY, MCTC, SCL), pp. 1012–1017.
- DAC-2009-ChaoYHLC #fault #metaprogramming #modelling
- Fault models for embedded-DRAM macros (MCTC, HYY, RFH, SCL, CYC), pp. 714–719.
- DAC-2006-ChaoCWCW #analysis #using
- Unknown-tolerance analysis and test-quality control for test response compaction using space compactors (MCTC, KTC, SW, STC, WW), pp. 1083–1088.
- DATE-2006-ChaoWCWC #using
- Coverage loss by using space compactors in presence of unknown values (MCTC, SW, STC, WW, KTC), pp. 1053–1054.
- DATE-v2-2004-MangoCWC #fault #testing
- Pattern Selection for Testing of Deep Sub-Micron Timing Defects (MCTC, LCW, KTC), p. 160.