Travelled to:4 × USA
Collaborated with:H.Tsai K.Cheng C.Lin I.Ghosh N.K.Jha T.J.Chakraborty R.Bencivenga
Talks about:test (4) scan (3) bist (3) base (3) control (2) scheme (2) use (2) algorithm (1) testabl (1) qualiti (1)
Person: Sudipta Bhawmik
DBLP: Bhawmik:Sudipta
Contributed to:
1999199819971991Wrote 4 papers:
- DAC-1999-TsaiCB #quality #using
- Improving the Test Quality for Scan-Based BIST Using a General Test Application Scheme (HCT, KTC, SB), pp. 748–753.
- DAC-1998-GhoshJB #analysis #testing
- A BIST Scheme for RTL Controller-Data Paths Based on Symbolic Testability Analysis (IG, NKJ, SB), pp. 554–559.
- DAC-1997-TsaiCLB #algorithm #hybrid
- A Hybrid Algorithm for Test Point Selection for Scan-Based BIST (HCT, KTC, CJL, SB), pp. 478–483.
- DAC-1991-ChakrabortyBBL #testing #using
- Enhanced Controllability for IDDQ Test Sets Using Partial Scan (TJC, SB, RB, CJL), pp. 278–281.