Travelled to:2 × USA
Collaborated with:S.Venkataraman R.Puri S.Griffith A.Oberai R.Madge G.Yeric Y.Zorian A.J.Strojwas M.Campbell V.Gerousis J.Hogan J.Kibarian M.Levitt D.Pramanik M.Templeton
Talks about:manufactur (1) target (1) yield (1) fault (1) work (1) when (1) miss (1) make (1) who (1)
Person: Walter Ng
DBLP: Ng:Walter
Contributed to:
20072004Wrote 2 papers:
- DAC-2007-VenkataramanPGOMYNZ
- Making Manufacturing Work For You (SV, RP, SG, AO, RM, GY, WN, YZ), pp. 107–108.
- DAC-2004-StrojwasCGHKLNPT #fault #question
- When IC yield missed the target, who is at fault? (AJS, MC, VG, JH, JK, ML, WN, DP, MT), p. 80.