Travelled to:1 × France
2 × USA
Collaborated with:R.Aitken D.Flynn S.Sinha V.Chandra B.Cline Y.Cao S.Venkataraman R.Puri S.Griffith A.Oberai R.Madge W.Ng Y.Zorian
Talks about:model (2) manufactur (1) technolog (1) parametr (1) silicon (1) predict (1) improv (1) explor (1) design (1) correl (1)
Person: Greg Yeric
DBLP: Yeric:Greg
Contributed to:
2012
20112007Wrote 3 papers:
- DAC-2012-SinhaYCCC #design #modelling #predict
- Exploring sub-20nm FinFET design with predictive technology models (SS, GY, VC, BC, YC), pp. 283–288.
- DATE-2011-AitkenYF #correlation #modelling #parametricity
- Correlating models and silicon for improved parametric yield (RA, GY, DF), pp. 1159–1163.
- DAC-2007-VenkataramanPGOMYNZ
- Making Manufacturing Work For You (SV, RP, SG, AO, RM, GY, WN, YZ), pp. 107–108.