Travelled to:1 × Germany
1 × USA
Collaborated with:K.Lai Y.Shi S.Chang T.Wang W.Wen M.Lee W.Hon
Talks about:threshold (1) dimension (1) constrain (1) monitor (1) circuit (1) voltag (1) integr (1) design (1) degrad (1) critic (1)
Person: Yu-Guang Chen
DBLP: Chen:Yu=Guang
Contributed to:
2014
2014Wrote 2 papers:
- DAC-2014-ChenWLWSC #design #monitoring #scalability
- Critical Path Monitor Enabled Dynamic Voltage Scaling for Graceful Degradation in Sub-Threshold Designs (YGC, TW, KYL, WYW, YS, SCC), p. 6.
- DATE-2014-ChenLLSHC #3d
- Yield and timing constrained spare TSV assignment for three-dimensional integrated circuits (YGC, KYL, MCL, YS, WKH, SCC), pp. 1–4.