Travelled to:
1 × Canada
1 × France
1 × Germany
1 × Norway
1 × United Kingdom
2 × Austria
2 × Spain
Collaborated with:
M.P.E.Heimdahl T.Byun ∅ C.Bunse D.Kim M.Zhang K.Ogata M.W.Whalen S.Rayadurgam M.Kim Y.Kim H.Kim
Talks about:
model (6) check (6) system (4) constraint (3) softwar (3) test (3) use (3) abstract (2) control (2) specif (2)
Person: Yunja Choi
DBLP: Choi:Yunja
Contributed to:
Wrote 10 papers:
- SAC-2015-ByunC #automation #constraints #operating system #safety #testing #using
- Automated system-level safety testing using constraint patterns for automotive operating systems (TB, YC), pp. 1815–1822.
- WRLA-2014-ZhangCO #framework #semantics #standard #𝕂
- A Formal Semantics of the OSEK/VDX Standard in 𝕂 Framework and Its Applications (MZ, YC, KO), pp. 280–296.
- SEFM-2013-Choi #constraints #generative #operating system #specification #testing
- Constraint Specification and Test Generation for OSEK/VDX-Based Operating Systems (YC), pp. 305–319.
- CBSE-2008-ChoiB #component #design #towards #verification
- Towards Component-Based Design and Verification of a µ-Controller (YC, CB), pp. 196–211.
- ICST-2008-KimCKK #model checking
- Pre-testing Flash Device Driver through Model Checking Techniques (MK, YC, YK, HK), pp. 475–484.
- ASE-2004-ChoiH #approach #case study #model checking
- Combination Model Checking: Approach and a Case Study (YC, MPEH), pp. 354–357.
- ASE-2003-ChoiH #abstraction #model checking #reduction #requirements #specification #using
- Model Checking Software Requirement Specifications using Domain Reduction Abstraction (YC, MPEH), pp. 314–317.
- ASE-2002-HeimdahlCW #analysis #model checking
- Deviation Analysis Through Model Checking (MPEH, YC, MWW), pp. 37–46.
- ESEC-FSE-2001-ChoiRH #abstraction #automation #constraints #model checking
- Automatic abstraction for model checking software systems with interrelated numeric constraints (YC, SR, MPEH), pp. 164–174.
- ASE-2019-KimC #embedded #model checking #using
- Model Checking Embedded Control Software using OS-in-the-Loop CEGAR (DK, YC), pp. 565–576.