Travelled to:4 × USA
Collaborated with:M.D.F.Wong Y.Du Q.Ma R.O.Topaloglu M.P.Lin Y.Chang Z.Xiao H.Tian H.Yi H.P.Wong
Talks about:pattern (4) doubl (2) self (2) rout (2) awar (2) decomposit (1) comparison (1) technolog (1) placement (1) thermal (1)
Person: Hongbo Zhang
DBLP: Zhang:Hongbo
Contributed to:
2014201220112009Wrote 4 papers:
- DAC-2014-XiaoDTWYWZ #self #verification
- Directed Self-Assembly (DSA) Template Pattern Verification (ZX, YD, HT, MDFW, HY, HSPW, HZ), p. 6.
- DAC-2012-0002ZW #comparison
- Triple patterning aware routing and its comparison with double patterning aware routing in 14nm technology (QM, HZ, MDFW), pp. 591–596.
- DAC-2011-ZhangDWT #composition #detection #self
- Self-aligned double patterning decomposition for overlay minimization and hot spot detection (HZ, YD, MDFW, ROT), pp. 71–76.
- DAC-2009-LinZWC
- Thermal-driven analog placement considering device matching (MPHL, HZ, MDFW, YWC), pp. 593–598.