Travelled to:2 × USA
Collaborated with:P.Yu D.Z.Pan M.Jung D.Z.Pan S.K.Lim
Talks about:awar (2) lithographi (1) reliabl (1) analysi (1) stress (1) mechan (1) detail (1) simul (1) radar (1) optim (1)
Person: Joydeep Mitra
DBLP: Mitra:Joydeep
Contributed to:
20112005Wrote 2 papers:
- DAC-2011-JungMPL #3d #analysis #optimisation #reliability
- TSV stress-aware full-chip mechanical reliability analysis and optimization for 3D IC (MJ, JM, DZP, SKL), pp. 188–193.
- DAC-2005-MitraYP #named #performance #simulation #using
- RADAR: RET-aware detailed routing using fast lithography simulations (JM, PY, DZP), pp. 369–372.